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Design from failure
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Despite several pre-validation efforts, unknown faults and quality degradation occurs all too frequently,
often because of the challenges designers and engineers face in trying to predict every customer's behavior of product usage
and the outcomes of sub-components interaction in a product or system.
In addition, there is no sufficient discussion on redesign procedures using failure analysis results.
Therefore, the overall objective of this research is to develop an architecture beyond just fixing failures,
in order to not only analyze the root causes of NFF failure and diagnose and prevent the failure
but also connect the relevant information and knowledge including analysis results to redesign products or systems efficiently.
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Development of an event-driven No-Fault-Found failure analysis method for zero-defect products (2012-2015) National Research Foundation (PI):
The overall goal of this project is to develop systematic methodologies that will enable manufacturers to quickly identify the root causes of NFF failures,
thereby preparing to make corrective action plans. Within this goal, the main objectives of the project are (i) to develop an event-driven fault diagnostics
and prognosis methods to identify the event patterns associated with various system failures states in order to take into account both functional interactions
between subsystems of the product and diverse user behaviour. In particular, time gaps between event occurrences will be included in fault pattern extraction
and matching methods, and (ii) to provide product designers and engineers with redesign guideline.
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Korea - EU collaboration to develop zero defect products and manufacturing systems (2010-2011) KIAT (PI)
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